WORKSHOPS
HARDWARE SECURITY MEETS FAILURE ANALYSIS
Wednesday 25 September
14:00 - 16:40
Room Paer
Organizers: Frank Altmann (Fraunhofer IMWS, Halle, Germany), Navid Asadi (University of Florida, USA)
​
Over the past decades, physical inspection of electronic hardware along the supply chain has become increasingly important to avoid counterfeits and device manipulations. Ongoing scaling of IC technologies and increasingly complexity by 3D integration pose permanent challenges for hardware security inspection. Thus, there is a need for advanced analysis methods for routine authenticity inspection, detection of hardware trojans and resilience testing of security features. The workshop brings together experts from industry and academia to discuss demands, challenges and experiences in the field of analysis for hardware security.
Speakers:
​
Debdeep Mukhopadhyay, Indian Institute of Technology, Kharagpur, India
Faults vs Cryptosystems: Whose Fault is it
Tuba Kiyan, TU Berlin, Germany
Unlocking the Scan Path by Optical Probing for Secret Data Extraction
Neel Leslie, Thermo Fisher Scientific, USA
A new Frontier for Chips Security Enabled by Electron Beam Probing
Michael Koegel, Fraunhofer IMWS, Germany
Lock-in Thermography for the Localization of Security Hard Blocks on SoC Devices
Arvind Sharma, Norwegian University of Science and Technology (NTNU), Norway
Hardware Security Assurance
Samuel Chef, Nanyang Technological University, Singapore
Toward Automated Large Scale Data Recovery from Logic State Images
Olivier Thomas, Texplained, France
Automating IC Reverse-Engineering for Backdoors / Trojans Detection (and more)
​