Technical Program Chairs

​

Francesco IANNUZZO - University of Alborg (DK) 

Matteo MENENGHINI - University of Padova (IT)

Giovanna MURA - University of Cagliari (IT)

​

Tracks in ESREF 2024

​

A - Quality and Reliability Assessment Techniques and Methods for Devices and Systems

• Edgar OLTHOF - NXP Semiconductors (NL)

• Cora SALM - University of Twente (NL)

​

B - Semiconductor Failure Mechanisms and Reliability for Si Technologies & Nanoelectronics

• Alain BRAVAIX - ISEN-Toulon (FR)

C - Progress in Failure Analysis: Defect Detection and Analysis

• Frank ALTMANN - Fraunhofer, IMWS-CAM (DE)

• Matteo MEDDA - STMicroelectronics (IT)

D - Reliability of Microwave Devices and Circuits

• Nathalie LABAT - IMS University of Bordeaux (FR)

• Michael DAMMANN - Fraunhofer IAF (DE)

E - Packaging- and Assembly Reliability and Failure Analysis

• Nicola DELMONTE - University of Parma (IT)

• Olaf WITTLER - Fraunhofer IZM (DE)

• Kirsten WEIDE-ZAAGE - University of Hannover (DE) 

• Rene RONGEN - NXP (NL)

​

F1 - Power Devices Reliability: Smart-Power Devices and Silicon Power Devices

• Giovanni BREGLIO - University of Napoli (IT)

• Zoubir KHATIR - Gustave Eiffel University (FR)

 

F2 - Power Devices Reliability: Wide Bandgap Devices

• Farid MEDJDOUB - CNRS-IEMN (FR)

• Matteo MENEGHINI - University of Padova (IT)

F3 - Power Devices Reliability: Power Electronic Systems

• Olivier CREPEL- Airbus (FR)

• Saeed PEYGHAMI - University of Alborg (DK)

G - Photonics Reliability

• Matteo BUFFOLO - University of Padova (IT)

• Yannick DESHAYES - IMS University of Bordeaux (FR)

H - MEMS and Sensors Reliability

• George PAPAIOANNOU - University of Athens (GR)

I - Extreme Environments and Radiation

• Marta BAGATIN - University of Padova  (IT)

• Francesco PINTACUDA - STMicroelectronics (IT)

L - Automotive and Industrial Electronic Reliability

• Ulrich ABELEIN - Infineon Technologies AG (DE) 

• Michael NELHIEBEL - KAI GmbH (AT)

• Nicola TRIVELLIN - University of Padova (IT)