SCOPE OF PAPERS
A
Quality and Reliability Assessment Techniques and Methods for Devices and Systems
Design for reliability, Built-in reliability, Virtual qualification, Reliability simulation, Advanced models for Reliability prediction, Reliability test structures, Limits to accelerated tests, Screening methods, Yield/reliability relationship, Obsolescence, Counterfeiting.
C
Progress in Failure Analysis: Defect Detection and Analysis
Electron-, ion-, and optical beam techniques, Scanning probe techniques, Static or dynamic techniques, Backside techniques, Acoustic microscopy, Electric or magnetic field based techniques, Electrical-, thermal-, and thermo-mechanical characterization, Sample preparation, Construction analysis, Failure analysis: case studies.
E
Packaging- and Assembly Reliability and Failure Analysis
Electrical modeling and simulations, Mechanical modeling and simulations, 3D/through-Silicon vias, Flip chip, Advanced substrates, Chip/package interaction.
F2
Power Devices Reliability: Wide-Bandgap Devices
.
G
Photonics Reliability
Solar cells and displays, optoelectronics, organic electronics: OLED, Electronic Ink, TFT.
I
Extreme Environments and Radiation
ESD-EOS, latchup, EMC-EMI in integrated circuits and power electronic systems, Radiation impact on circuits and system reliability.
B
Semiconductor Failure Mechanisms and Reliability for Si Technology and Nanoelectronics
Process-related issues, Passivation stability, Hot carriers injection, NBTI, TDDB, High-K dielectrics and gate stacks, Low-K dielectrics and Cu interconnects, Metal migration: mechanical and thermal aspects, Non-volatile and programmable cells, Silicon-on-Insulator devices, Nano-electronics, Nano-electronic materials for solid state devices.
D
Reliability of Microwave Devices and Circuits
Wide-bandgap- and other Microwave semiconductor devices.
F1
Power Devices Reliability:
Smart-Power Devices and Silicon Power Devices
.
F3
Power Devices Reliability: Power Electronic Systems
.
H
MEMS and Sensor Reliability
Bio-electronics, Bio-sensors, Nano-bio-technologies, MEMS and MOEMS, NEMS and nano-objects.
L
Automotive and Industrial Electronic Reliability
EVs, HEVs, batteries, powertrains, supercaps, charging stations, V2G, thermal management, standardization.